表面和材料科学应用
Surface and Material Sciences Applications
Surface and Material Science applications, including: TOF-SIMS with Profiling function, SEM/FIB & FE-SEM, Quantum Diamond Atomic Force Microscope (QDAFM), Scanning NV Microscope, W-Band High-frequency EPR Spectrometer, Optically Detected Magnetic Resonance Spectrometer, H2O2 Analyzers, Surface Sorption Analyzers and Contact Angle Analyzers.
具有分析功能的 TOF-SIMS
TOF-SIMS with Profiling function
The SurfaceSeer I is a high sensitivity TOF-SIMS for imaging and chemical mapping of insulating and conducting surfaces. The SurfaceSeer I is ideal for investigating the chemistry of surfaces and is equally at home in R&D as well as industrial quality control applications.
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表面吸附（BET 分析）应用
Surface Sorption (BET Analysis) Applications
The iPore series full-automatic surface area and pore size analyzers are designed and manufactured using the classic static volumetric principle, which complies with ISO15901, ASTM D3663/D4661 and GB/ T19587-2017 for measurement of specific surface area, pore size distribution and total pore volume of porous materials such as zeolite (molecular sieves), carbon materials, metal oxides, MOF, COF, graphene and so on.
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SEM、SEM/FIB 和 FE-SEM 应用
SEM, SEM/FIB & FE-SEM Applications
CIQTEK offers a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability, as well as an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV.
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光学检测磁共振波谱仪
Optically Detected Magnetic Resonance Spectrometer
CIQTEK Optically Detected Magnetic Resonance Spectrometer (ODMR) is a quantum experimental platform based on nitrogen-vacancy center (NV center) spin magnetic resonance. By controlling basic physical quantities such as optics, electricity, and magnetism, it implements quantum manipulation and readout of NV center in diamond.
Compared with traditional paramagnetic resonance and nuclear magnetic resonance, it has the advantages that the initial state is the pure quantum state, long spin-quantum coherence time, powerful quantum manipulation, and intuitive results of quantum collapse experiments.
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量子金刚石原子力显微镜 (QDAFM)（环境和低温操作
Quantum Diamond Atomic Force Microscope (QDAFM) (Ambient & Cryogenic Operations)
CIQTEK Quantum Diamond Microscope (QDM) is a wide-field magnetic resonance based on the principle of spin magnetic resonance in the diamond nitrogen-vacancy center (NV center). The spin quantum state of the NV center luminescence defects is susceptible to the surrounding microwave and static magnetic fields and can be read out using a laser.
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扫描 NV 显微镜
Scanning NV Microscope
CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and readout of the spin state in the diamond probe.
Based on the NV diamond magnetometry, it has nanoscale spatial resolution and ultra-high detection sensitivity and can be used to develop and study magnetic textures, high-density magnetic storage, and spintronics.
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W 波段高频 EPR 波谱仪
W-Band High-frequency EPR Spectrometer
CIQTEK EPR-W900 is a W-band (94 GHz) high-frequency electron paramagnetic resonance (EPR or ESR) spectrometer compatible with both continuous wave and pulsed EPR test functions. It is paired with a slit-type superconducting magnet with a maximum magnetic field of 6 T and can perform variable temperature experiments from 4-300 K.
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SEM 磁控溅射装置
Magnetron Sputtering Device for SEM
In order for samples to be imaged in an electron microscope, they need to be conductive, which is accomplished by coating the sample with a conductive layer to suppress charge, reduce thermal damage, and increase the secondary electron signal required for localized inspection in the SEM.
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半导体制程使用的超纯水 (UPW) 中的 H2O2 检测仪
H2O2 Detection in Ultra Pure Water (UPW) used in Semicon Fabrication Facilities
In the demanding and dynamic world of process control and quality assurance, Aero-Laser’s AL2021 emerges as a game-changer. Designed for professionals in process control and quality assurance who demand nothing but the utmost accuracy, reliability, and efficiency this cutting-edge instrument is the ultimate technology for measuring down to sub ppb hydrogen peroxide / H2O2 concentrations in both gases and liquids.
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phone: +852 2856 0606 or email: admin@guyline-asia.com
接触角分析解决方案
Contact Angle Analysing Solutions
Contact Angle Analyzer available upon request.
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phone: +852 2856 0606 or email: admin@guyline-asia.com
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